Deep Learning Optimization for Edge Devices: Analysis of Training Quantization Parameters
Published in IECON Proc. (Industrial Electron. Conf., 2019
Recommended citation: Alicja Kwasniewska, Maciej Szankin, Mateusz Ozga, Jason Wolfe, Arun Das, Adam Zajac, Jacek Ruminski, Paul Rad, "Deep Learning Optimization for Edge Devices: Analysis of Training Quantization Parameters." IECON Proc. (Industrial Electron. Conf., 2019. https://ieeexplore.ieee.org/document/8927153/